This study uses the new global patent map developed by Kay et al. (2014) to reflect the patenting activity of Spain together with the activity of the Basque Country, a highly industrialised region in Spain, for the time interval 2000-2006. The global patent map reflects the technology categories where a patent could be categorised according to the international patent classification (IPC) system, in addition to the degree of similarity among different IPCs, determined by using the citing-to-cited relationships as bonds between categories. An overlay method has been developed to compare, on the one hand, the patenting activity in Spain and the Basque Country and a display of the most important technology sectors and; on the other, the selection of a technology sector and an analysis of technology transfer in both regions through different IPCs to compare them and determine the possible technological sources remaining for development.
Author(s): Javier Gavilanes-Trapote, Rosa María Río-Belver, Ernesto Cilleruelo, Gaizka Garechana, Jaso Larruscain
Organization(s): University of the Basque Country
Source: International Journal of Technology Management